Live opening · Posted 7 days ago

Materials Scientist, Dual Beam Analysis

Eurofins · Milpitas, CA, United States
Smartrecruiters No Full-time
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At a glance

The key details from the original listing.

Posted 7 days ago
CompanyEurofins
LocationMilpitas, CA, United States
Job typeFull-time
Work modeNo
SourceSmartrecruiters
Listed7 days ago

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About the role

Description supplied by the original job listing.

Join our innovative Dual Beam Analysis team, where you'll work with state-of-the-art microscopy tools to support imaging and materials analysis of client samples. We're seeking a skilled Scientist with expertise in Dual Beam FIB/SEM technology to play a critical role in advanced microscopy investigations.
In this role, you'll prepare high-quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross-sections to support detailed structural, compositional, and failure analysis for clients across diverse industries. You'll also contribute to critical dimension (CD) measurements, process optimization, and work closely with cross-functional teams to deliver timely analytical results for a wide range of semiconductor and materials characterization projects.
The ideal candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering results for clients.
What You'll Do:
Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.
Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
Perform image processing and analysis on 2D/3D FIB/SEM datasets.
Improve throughput, repeatability, and data quality of Dual Beam services.
Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.
Work Schedule: *5pm-2am, Tuesdays to Saturdays (*Shift differential will apply)
MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.
Must have in-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
Expert with SEM/EDX, or TEM sample preparation.
Solid understanding of semiconductor device physics and failure analysis (through previous work experience or course work).
Excellent communication skills (written, verbal and presentation).
What would set you apart:
Experience with semiconductor chip products and wafer samples is a plus.

Employment type
Full-time

Work arrangement
No

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