Senior ATE Test Lead | Teradyne J750

Job Summary:
We are seeking an experienced ATE Test Engineer to join our team. The successful candidate will have 5-10 years of experience in digital testing, with a strong background in microcontroller testing, particularly with flash memory. The candidate should have hands-on experience with J750 or equivalent digital testers and be able to clearly provide DFT (Design for Test) requirements to design teams. The candidate should also have experience in test time improvement and have a proven track record of releasing multiple products to production with good yield.
Key Responsibilities:
Test Program Development: Develop, debug, and optimize test programs for digital devices, including microcontrollers with flash memory, using J750 or equivalent digital testers.
DFT Requirement Definition: Clearly define and provide DFT requirements to design teams to ensure testability of digital devices.
Test Time Improvement: Understand different test methodology to improve test times to reduce test costs and improve production efficiency.
Test Solution Design: Design and implement test solutions that meet customer requirements, ensuring high-quality and efficient test programs.
Test Data Analysis: Analyze test data to identify trends, issues, and opportunities for improvement, and implement corrective actions as needed.
Collaboration and Communication: Collaborate with cross-functional teams, including design, system, and product engineering, to ensure seamless test program development and implementation.
Product Release: Release multiple products to production with good yield, ensuring that test programs are optimized for production and meet customer requirements.
Requirements:
Education: Bachelor's degree in Electrical Engineering, Computer Engineering, or a related field.
Experience: 5-10 years of experience in digital testing, with a focus on microcontroller testing, particularly with flash memory.
J750 or Equivalent Digital Tester Experience: Hands-on experience with J750 or equivalent digital testers, including programming, operation, and maintenance.
DFT Knowledge: Strong knowledge of DFT principles and practices, including scan design, boundary scan, and JTAG.
Test Time Improvement: Experience in test time improvement, including test program optimization and test solution design.
Product Release Experience: Proven track record of releasing multiple products to production with good yield.
Programming Skills: Proficiency in programming languages, such as C, C++, or Python.
Device Knowledge: Understand the basic analog IP and digital blocks on functional and parameteric level to drive the test plan
Communication and Collaboration: Excellent communication and collaboration skills, with the ability to work effectively with cross-functional teams.

Work arrangement
No